Single-shot dynamic transmission electron microscopy

Journal Article · Mon Jul 24 04:00:00 EDT 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2236263· OSTI ID:20860609

LaGrange, T; Armstrong, M R; Boyden, K; Brown, C G; Campbell, G H; Colvin, J D; De Hope, W J; Frank, A M; Gibson, D J; Hartemann, F V; Kim, J S; King, W E; Pyke, B J; Reed, B W; Shirk, M D; Shuttlesworth, R M; Stuart, B C; Torralva, B R; Browning, N D ^[1]

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1. Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States)

A dynamic transmission electron microscope (DTEM) has been designed and implemented to study structural dynamics in condensed matter systems. The DTEM is a conventional in situ transmission electron microscope (TEM) modified to drive material processes with a nanosecond laser, 'pump' pulse and measure it shortly afterward with a 30-ns-long probe pulse of {approx}10{sup 7} electrons. An image with a resolution of <20 nm may be obtained with a single pulse, largely eliminating the need to average multiple measurements and enabling the study of unique, irreversible events with nanosecond- and nanometer-scale resolution. Space charge effects, while unavoidable at such a high current, may be kept to reasonable levels by appropriate choices of operating parameters. Applications include the study of phase transformations and defect dynamics at length and time scales difficult to access with any other technique. This single-shot approach is complementary to stroboscopic TEM, which is capable of much higher temporal resolution but is restricted to the study of processes with a very high degree of repeatability.

• OSTI ID: 20860609
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 89; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
IMAGES
NANOSTRUCTURES
PHASE TRANSFORMATIONS
RESOLUTION
SPACE CHARGE
TRANSMISSION ELECTRON MICROSCOPY