High Temperature Ion-Irradiation Effects on Microstructural Evolution in {beta}-SiC

Journal Article · Tue Jul 15 04:00:00 EDT 2003 · Fusion Science and Technology

OSTI ID:20849509

Kondo, Sosuke ^[1]; Park, Keyong Hwan ^[1]; Katoh, Yutai ^[2]; Kohyama, Akira ^[2]

---

1. Graduate School of Energy Science, Kyoto University (Japan)
2. Institute of Advanced Energy, Kyoto University (Japan)

High temperature and high dose irradiation effects on microstructural evolution in high purity {beta}-SiC was studied by Single- and dual-ion irradiation, where 5.1 MeV Si{sup 2+} ions for displacement damage and 1 MeV He{sup +} ions for (n, {alpha}) simulation were implanted at 1673 K. From a cross-sectional transmission electron microscopy (XTEM) study of the {beta}-SiC irradiated with single-ion up to a dose of 100 dpa, high density dislocation loops were observed. Sizes and concentrations of the loops are dependant on displacement damage level. In the dual-ion irradiated specimen, dislocation network was observed through the dual-ion irradiated region. At the same time, cavities were formed in both the grain and grain boundary. In front of the irradiated surface, localized growth of the cavities was observed. TEM micrographs demonstrate that the helium had a large mobility on grain boundary and dislocation network under high temperature irradiation. It is clarified that helium largely contributes to the development of irradiation-induced microstructural defects. The formation mechanisms of microstructural defects were also discussed.

• OSTI ID: 20849509
• Journal Information: Fusion Science and Technology, Journal Name: Fusion Science and Technology Journal Issue: 1 Vol. 44; ISSN 1536-1055
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ATOMIC DISPLACEMENTS
COMPUTERIZED SIMULATION
DENSITY
DISLOCATIONS
GRAIN BOUNDARIES
HELIUM
HELIUM IONS
IRRADIATION
MEV RANGE
SILICON IONS
THERMONUCLEAR REACTOR MATERIALS
TRANSMISSION ELECTRON MICROSCOPY