Interpretation of laser scans from thin-film polycrystalline photovoltaic modules
- Colorado State Univ., Fort Collins, CO (United States)
- National Renewable Energy Lab., Golden, CO (United States)
Laser scanning of photovoltaic devices and modules with submillimeter resolution can provide valuable information about localized defects and cell-to-cell variations in response. There are, however, sources of possible errors, or artifacts, in interpretation that must be addressed,e specially when series-connected cells are scanned. These issues are addressed for thin film CdTe and CuInSe{sub 2} (CIS) modules and cells using a recently developed computer-controlled large-scale laser scanner at the National Renewable Energy Laboratory (NREL). This instrument was designed to serve as a tool for research, device and module quality control, and module failure analysis. The thrust of the report is twofold: (1) the development of reliable submillimeter module characterization techniques and analysis and (2) presentation of the results of such techniques as applied to thin film CdTe and CIS modules.
- DOE Contract Number:
- AC36-83CH10093
- OSTI ID:
- 208062
- Report Number(s):
- CONF-941203--; ISBN 0-7803-1459-X
- Country of Publication:
- United States
- Language:
- English
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