Tribochemical wear of sodium trisilicate glass at the nanometer size scale
- Physics Department, Washington State University, Pullman, Washington 99164-2814 (United States)
We report measurements of single-asperity wear on sodium trisilicate glass in basic solution using atomic force microscopy (AFM), where the silicon nitride tip was used both to tribologically load and image the surface. Single-asperity micron-square polishing was performed by rastering the AFM tip in a square pattern. More localized, 'nano'-machining was performed by drawing the AFM tip back and forth across the substrate in a linear fashion. In both modes, the wear rate gradually slowed during prolonged scanning. Changes in contact stress due to the wear of the AFM tip dramatically affect the observed wear rates. The changes in surface elevation for both the tip and the substrate display the same dependence on true stress and time for the case of square-raster scanning over micron dimensions. In the case of linear reciprocal scanning, conformal wear substantially modifies the rates and morphology of the wear of both the tip and the substrate.
- OSTI ID:
- 20787797
- Journal Information:
- Journal of Applied Physics, Vol. 99, Issue 2; Other Information: DOI: 10.1063/1.2166646; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
Similar Records
Combined surface characterization and tribological (friction and wear) studies of CVD diamond films
I. Electron transfer reactions in binuclear model systems. II. Scanning probe microscopy studies of transition metal dichalcogenides materials: Atomic to nanometer scale properties and surface modifications