Calculated energy loss of swift He, Li, B, and N ions in SiO{sub 2}, Al{sub 2}O{sub 3}, and ZrO{sub 2}

Journal Article · Tue Nov 15 00:00:00 EST 2005 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.72.0· OSTI ID:20786524

Heredia-Avalos, Santiago; Garcia-Molina, Rafael; Fernandez-Varea, Jose M; Abril, Isabel ^[1]

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1. Departamento de Fisica, Universidad de Murcia, Apartado 4021, E-30080 Murcia (Spain)

We have calculated the electronic stopping power and the energy-loss straggling parameter of swift He, Li, B, and N ions moving through several oxides, namely SiO{sub 2}, Al{sub 2}O{sub 3}, and ZrO{sub 2}. The evaluation of these stopping magnitudes was done in the framework of the dielectric formalism. The target properties are described by means of a combination of Mermin-type energy-loss functions that characterize the response of valence-band electrons, together with generalized oscillator strengths to take into account the ionization of inner-shell electrons. We have considered the different charge states that the projectile can have, as a result of electron capture and loss processes, during its motion through the target. The electron density for each charge state was described using the Brandt-Kitagawa statistical model and, for He and Li ions, also hydrogenic orbitals. This procedure provides a realistic representation of both the excitation properties of the target electrons and the projectile charge density, yielding stopping powers that compare reasonably well with available experimental data above a few tens of keV/amu.

• OSTI ID: 20786524
• Journal Information: Physical Review. A, Vol. 72, Issue 5; Other Information: DOI: 10.1103/PhysRevA.72.052902; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
ABSORPTION
ALUMINIUM OXIDES
BORON IONS
CHARGE DENSITY
CHARGE STATES
COMPARATIVE EVALUATIONS
DIELECTRIC MATERIALS
ELECTRON CAPTURE
ELECTRON DENSITY
ELECTRONS
ENERGY LOSSES
EXCITATION
HELIUM IONS
INNER-SHELL IONIZATION
KEV RANGE
LITHIUM IONS
NITROGEN IONS
OSCILLATOR STRENGTHS
SILICON OXIDES
STOPPING POWER
VALENCE
ZIRCONIUM OXIDES