Differential cross-section measurements of multiply charged xenon ions produced in 10-28-keV e{sup -}-Xe collisions
- Atomic Physics Laboratory, Department of Physics, Banaras Hindu University, Varanasi 221 005 (India)
Partial single-differential ionization cross sections (PSDICSs) of a multiply ionized xenon atom (Xe{sup n+}, n=1-7) are measured for impact of 10-28 keV electrons with xenon by performing coincidences between the produced recoil ions and the electrons of indiscriminated energies detected at 90 deg. with respect to the incident electron beam direction. Values of relative PSDICSs for doubly charged ions are found to be about 25% larger than those for singly charged ions in the considered impact energy range. The examination of charge-state fractions and relative cross-section fractions of multiply charged ions as a function of incident electron energy suggests that the multiply charged ions are produced via creation of an inner-shell vacancy followed by Auger and shakeoff processes. The mean charge state of the ions produced in the collisions is found to be independent of the impact energy and reaches a constant value close to 2.6. The Fano-Bethe plots of the PSDICSs suggest that higher charge states of the ions are weakly produced via optical transitions; moreover, the latter process becomes a dominant channel for producing the doubly charged ions that are correlated with the electrons detected at 90 deg.
- OSTI ID:
- 20786508
- Journal Information:
- Physical Review. A, Vol. 72, Issue 5; Other Information: DOI: 10.1103/PhysRevA.72.052705; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- English
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