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Effect of Te precipitates on the performance of CdZnTe detectors

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.2189912· OSTI ID:20779170
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  1. Department of Nonproliferation and National Security, Brookhaven National Laboratory, Upton, New York 11973-5000 (United States)

Measurements using the National Synchrotron Light Source provided a detailed comparisons of the microscale detector response and infrared microscopy images for CdZnTe Frisch-ring x-ray and gamma detectors. Analysis of the data showed conclusively that local deteriorations of the electron charge collection and x-ray device response fully correlate with the presence of Te precipitates as seen in the IR images. Effects of the surface processing conditions on the detector performance were also clearly observed.

OSTI ID:
20779170
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 14 Vol. 88; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English