Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source

Journal Article · Wed Mar 15 00:00:00 EST 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2172357· OSTI ID:20778986

Cao, Y; Sun, L T; Ma, L; Ma, B H; Wang, H; Feng, Y C; Li, J Y; Zhao, H W; Zhang, Z M; Zhang, X Z; He, W; Zhao, H Y; Guo, X; Li, X X ^[1]

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1. Institute of Modern Physics (IMP), Chinese Academy of Sciences, Lanzhou, Gansuo 730000 (China)

With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modern Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article.

• OSTI ID: 20778986
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 3; Conference: 11. international conference on ion sources, Caen (France), 12-16 Sep 2005; Other Information: DOI: 10.1063/1.2172357; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM EXTRACTION
ECR ION SOURCES
ELECTRON CYCLOTRON-RESONANCE
ION BEAMS
PARTICLE BEAMS