Comment on 'Destructive Effect of Disorder and Bias Voltage on Interface Resonance Transmission in Symmetric Tunnel Junctions'
Journal Article
·
· Physical Review Letters
- Department of Physics and Astronomy University of Nebraska-Lincoln Lincoln, Nebraska 68588 (United States)
A Comment on the Letter by C. Tusche et al., Phys. Rev. Lett. 95, 176101 (2005). The authors of the Letter offer a Reply.
- OSTI ID:
- 20778839
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 11 Vol. 96; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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