Catalytic action of {beta} source on x-ray emission from plasma focus
- Department of Physics, Quaid-i-Azam University, 45320 Islamabad (Pakistan)
The influence of preionization around the insulator sleeve by a mesh-type {beta} source ({sub 28}Ni{sup 63}) for the x-ray emission from a (2.3-3.9 kJ) plasma focus device is investigated. Quantrad Si p-i-n diodes along with suitable filters are employed as time-resolved x-ray detectors and a multipinhole camera with absorption filters is used for time-integrated analysis. X-ray emission in 4{pi} geometry is measured as a function of argon and hydrogen gas filling pressures with and without {beta} source at different charging voltages. It is found that the pressure range for the x-ray emission is broadened, x-ray emission is enhanced, and shot to shot reproducibility is improved with the {beta} source. With argon, the Cu K{alpha} emission is estimated to be 27.14 J with an efficiency of 0.7% for {beta} source and 21.5 J with an efficiency of 0.55% without {beta} source. The maximum x-ray yield in 4{pi} geometry is found to be about 68.90 J with an efficiency of 1.8% for {beta} source and 54.58 J with an efficiency of 1.4% without {beta} source. With hydrogen, Cu K{alpha} emission is 11.82 J with an efficiency of 0.32% for {beta} source and 10.07 J with an efficiency of 0.27% without {beta} source. The maximum x-ray yield in 4{pi} geometry is found to be 30.20 J with an efficiency of 0.77% for {beta} source and 25.58 J with an efficiency of 0.6% without {beta} source. The x-ray emission with Pb insert at the anode tip without {beta} source is also investigated and found to be reproducible and significantly high. The maximum x-ray yield is estimated to be 46.6 J in 4{pi} geometry with an efficiency of 1.4% at 23 kV charging voltage. However, degradation of x-ray yield is observed when charging voltage exceeds 23 kV for Pb insert. From pinhole images it is observed that the x-ray emission due to the bombardment of electrons at the anode tip is dominant in both with and without {beta} source.
- OSTI ID:
- 20778558
- Journal Information:
- Review of Scientific Instruments, Vol. 77, Issue 1; Other Information: DOI: 10.1063/1.2162451; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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