Valence Band X-Ray Emission Spectra of Compressed Germanium
- Geophysical Laboratory, Carnegie Institution of Washington, 5251 Broad Branch Road NW, Washington, DC 20015 (United States)
- Steacie Institute for Molecular Science, National Research Council of Canada, 100 Sussex Drive, Ottawa, Ontario, K1A 0R6 (Canada)
- HPCAT, Carnegie Institution of Washington, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- NSLS, Brookhaven National Laboratory, Upton, New York 11973 (United States)
We report measurements of the valence band width in compressed Ge determined from x-ray emission spectra below the Ge K edge. The width of the valence band does not show any pressure dependence in the semiconducting diamond-type structure of Ge below 10 GPa. On the other hand, in the metallic {beta}-Sn phase above 10 GPa the valence band width increases under compression. Density-functional calculations show an increasing valence band width under compression both in the semiconducting phase (contrary to experiment) and in the metallic {beta}-Sn phase of Ge (in agreement with observed pressure-induced broadening). The pressure-independent valence band width in the semiconducting phase of Ge appears to require theoretical advances beyond the density-functional theory or the GW approximation.
- OSTI ID:
- 20777136
- Journal Information:
- Physical Review Letters, Vol. 96, Issue 13; Other Information: DOI: 10.1103/PhysRevLett.96.137402; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
- Country of Publication:
- United States
- Language:
- English
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