A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method

Journal Article · Wed Dec 15 00:00:00 EST 2004 · Materials Characterization

DOI:https://doi.org/10.1016/j.matchar.2004.09.003· OSTI ID:20748653

Zhenming, Xu ^[1]; Zhenqi, Guo ^[2]; Jianguo, Li ^[1]

---

1. School of Environmental Science and Engineering, Shanghai Jiaotong University, 800 Dongchuan Road, Shanghai 200240 (China)
2. Instrument Analytical Center, Northwestern University, Xi'an 710069 (China)

A new method for the evaluation of the quality of an Ohno continuous cast (OCC) Cu single crystal by X-ray diffraction (XRD) butterfly pattern was brought forward. Experimental results show that the growth direction of single crystal Cu is inclined from both sides of the single crystal Cu rod to the axis and is axially symmetric. The degree of deviation from the [100] orientation from the crystal axis is less than 5 deg. with a casting speed 10-40 mm/min. The orientation of single crystal Cu does not have a fixed direction but is in a regular range. Moreover, the orientation of stray grains in the single crystal Cu is random from continuous casting.

• OSTI ID: 20748653
• Journal Information: Materials Characterization, Vol. 53, Issue 5; Other Information: DOI: 10.1016/j.matchar.2004.09.003; PII: S1044-5803(04)00205-0; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AXIAL SYMMETRY
CASTING
CASTINGS
CRYSTAL GROWTH
EVALUATION
MONOCRYSTALS
ORIENTATION
RODS
VELOCITY
X-RAY DIFFRACTION