Template induced sol-gel synthesis of highly ordered LaNiO{sub 3} nanowires

Journal Article · Fri Apr 15 00:00:00 EDT 2005 · Journal of Solid State Chemistry

DOI:https://doi.org/10.1016/j.jssc.2005.01.022· OSTI ID:20725885

Zhi, Yang ^[1]; Yi, Huang ^[1]; Bin, Dong ^[1]; Hulin, Li ^[1]

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1. College of Chemistry and Chemical Engineering, Lanzhou University, No. 222, Tianshui South Road, Gansu Province, Lanzhou City 730000 (China)

The highly ordered LaNiO{sub 3} nanowires of the rare-earth perovskite-type composite oxide were controlled synthesized within a porous anodic aluminum oxide (AAO) template by means of sol-gel method using nitrate as raw materials and citric acid as chelating agent. The results of scanning electron microscopy (SEM) and transmission electron microscopy (TEM) revealed that the obtained LaNiO{sub 3} nanowires had a uniform length and diameter, which were determined by the thickness and the pore diameter of the applied AAO template. The results of X-ray diffraction (XRD) and the selected-area electron diffraction (SAED) indicated that the LaNiO{sub 3} nanowires were perovskite-type crystalline structures. Furthermore, X-ray photoelectron spectroscopy (XPS) and the energy dispersive X-ray (EDX) spectroscopy demonstrated that the stoichiometric LaNiO{sub 3} was formed.

• OSTI ID: 20725885
• Journal Information: Journal of Solid State Chemistry, Vol. 178, Issue 4; Other Information: DOI: 10.1016/j.jssc.2005.01.022; PII: S0022-4596(05)00031-9; Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ALUMINIUM OXIDES
CHELATING AGENTS
CITRIC ACID
ELECTRON DIFFRACTION
LANTHANUM COMPOUNDS
NICKEL COMPOUNDS
NITRATES
OXIDES
PEROVSKITE
POROUS MATERIALS
QUANTUM WIRES
RAW MATERIALS
SCANNING ELECTRON MICROSCOPY
SOL-GEL PROCESS
STOICHIOMETRY
SYNTHESIS
TRANSMISSION ELECTRON MICROSCOPY
WIRES
X RADIATION
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY