High-resolution transmission electron microscopy investigation of nanostructures in SnO{sub 2} thin films prepared by pulsed laser deposition
- Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon Tong, Hong Kong (China)
Pulsed laser deposition (PLD) was used to grow nanocrystalline SnO{sub 2} thin films onto glass substrates. The nanocrystallites and microstructures in SnO{sub 2} thin films grown by PLD techniques have been investigated in detail by using X-ray diffraction and high-resolution transmission electron microscopy (HRTEM). The PLD process was carried out at room temperature under a working pressure of about 2x10{sup -6}mbar. Experimental results indicate that thin films are composed of a polycrystalline SnO{sub 2} and an amorphous SnO phase. In particular, the presence of such an amorphous SnO phase in the thin films greatly limits their practical use as gas-sensing devices. HRTEM observations revealed that SnO{sub 2} nanocrystallites with tetragonal rutile structure embed in an amorphous SnO matrix, which are approximatively equiaxed. These approximatively equiaxed SnO{sub 2} nanocrystallites contain a high density of defects, such as twin boundaries and edge dislocations. The grain growth of SnO{sub 2} thin films may be discussed in terms of the coalescent particle growth mechanism.
- OSTI ID:
- 20725849
- Journal Information:
- Journal of Solid State Chemistry, Journal Name: Journal of Solid State Chemistry Journal Issue: 3 Vol. 178; ISSN 0022-4596; ISSN JSSCBI
- Country of Publication:
- United States
- Language:
- English
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