Cross calibration of new x-ray films against direct exposure film from 1 to 8 keV using the X-pinch x-ray source

Journal Article · Tue Nov 15 04:00:00 EST 2005 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2135276· OSTI ID:20723239

Chandler, K M; Pikuz, S A; Shelkovenko, T A; Mitchell, M D; Hammer, D A; Knauer, J P ^[1]

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1. Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853 (United States)

A cross calibration of readily available x-ray sensitive films has been carried out against the calibrated direct exposure film (DEF) which is no longer being manufactured by Kodak. Four-wire X pinches made from various metal wires were used as x-ray sources for this purpose. Tests were carried out for the Kodak films Biomax MS, Biomax XAR, M100, Technical Pan, and T-Max over the energy range of 1-8 keV (12.4-1.5 A wavelength). The same hand-development procedures as described by Henke et al. [J. Opt. Soc. Am. B 3, 1540 (1986)] were followed for all films in every test. Sensitivity curves as a function of wavelength for these films relative DEF are presented. These relative calibrations show that Biomax MS is likely to be the best replacement film for DEF for most purposes over the energy range tested here.

• OSTI ID: 20723239
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 11 Vol. 76; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
FILMS
KEV RANGE
PLASMA
PLASMA DIAGNOSTICS
SENSITIVITY
WAVELENGTHS
WIRES
X RADIATION
X-RAY SOURCES