Scanning low-temperature element-specific magnetic microscopy

Journal Article · Wed Jun 15 00:00:00 EDT 2005 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1921510· OSTI ID:20722904

Cady, A; Haskel, D; Lang, J C; Srajer, G; Chupas, P; Osborn, R; Mitchell, J F; Ahn, J S; Hur, N; Park, S; Cheong, S -W ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

We have developed a low-temperature element-specific magnetic microscopy instrument at beamline 4-ID-D of the Advanced Photon Source. The setup enables simultaneous chemical and magnetic characterization of materials with {approx}1 {mu}m{sup 2} resolution at low temperature (>10 K) under a moderate applied field (<0.8 T). We demonstrate the potential of this apparatus by presenting results correlating chemical and magnetic local behavior in inhomogeneous layered manganites and multiferroic systems.

• OSTI ID: 20722904
• Journal Information: Review of Scientific Instruments, Vol. 76, Issue 6; Other Information: DOI: 10.1063/1.1921510; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ADVANCED PHOTON SOURCE
ANTIFERROMAGNETIC MATERIALS
EQUIPMENT
FERROELECTRIC MATERIALS
FERROMAGNETIC MATERIALS
LANTHANUM COMPOUNDS
LUTETIUM COMPOUNDS
MAGNETORESISTANCE
MICROSCOPY
PARAMAGNETISM
RESOLUTION
STRONTIUM COMPOUNDS
TEMPERATURE RANGE 0065-0273 K
X RADIATION