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Title: Charge distribution and local structure and speciation in the UO{sub 2+x} and PuO{sub 2+x} binary oxides for x=<0.25

Journal Article · · Journal of Solid State Chemistry
 [1];  [2];  [3]
  1. Los Alamos National Laboratory, Chemistry Division, Materials Science and Technology Division and Nuclear Materials Technology Division, Los Alamos, NM 87545 (United States)
  2. Australian Nuclear Science and Technolgy Organisation, Menai, NSW 2234 (Australia)
  3. Los Alamos National Laboratory, Chemistry Division, Materials Science and Technology Division and Nuclear Materials Technology Division, Los Alamos, NM 87545 (United States); and others

The local structure and chemical speciation of the mixed valence, fluorite-based oxides UO{sub 2+x} (0.00=<x=<0.20) and PuO{sub 2+x}/PuO{sub 2+x-y}(OH){sub 2y}.zH{sub 2}O have been determined by U/Pu L{sub III} XAFS spectroscopy. The U spectra indicate (1) that the O atoms are incorporated as oxo groups at short (1.75A) U-O distances consistent with U(VI) concomitant with a large range of U displacements that reduce the apparent number of U neighbors and (2) that the UO{sub 2} fraction remains intact implying that these O defects interact to form clusters and give the heterogeneous structure consistent with the diffraction patterns. The PuO{sub 2+x} system, which does not show a separate phase at its x=0.25 endpoint, also displays (1) oxo groups at longer 1.9A distances consistent with Pu(V+{delta}), (2) a multisite Pu-O distribution even when x is close to zero indicative of the formation of stable species with H{sub 2}O and its hydrolysis products with O{sup 2-}, and (3) a highly disordered, spectroscopically invisible Pu-Pu component. The structure and bonding in AnO{sub 2+x} are therefore more complicated than have previously been assumed and show both similarities but also distinct differences among the different elements.

OSTI ID:
20721762
Journal Information:
Journal of Solid State Chemistry, Vol. 178, Issue 2; Other Information: DOI: 10.1016/j.jssc.2004.09.029; PII: S0022-4596(04)00515-8; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English