Thermoelectric properties of Te-doped CoSb{sub 3} by spark plasma sintering
Journal Article
·
· Journal of Applied Physics
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, 1295 Dingxi Road, Shanghai 200050 (China)
Te-doped CoSb{sub 3} bulk polycrystalline materials Co{sub 4}Sb{sub 12-x}Te{sub x} have been prepared by melting, annealing, and spark plasma sintering and have been characterized by x-ray diffraction. From the lattice constants of the Te-doped samples, a Te substituting fraction limit for Sb is estimated to be x=0.55. The Hall effect, Seebeck coefficient, electrical-conductivity, and thermal-conductivity measurements were performed between room temperature and 900 K. The Te-doped materials Co{sub 4}Sb{sub 12-x}Te{sub x} show an n-type conduction. As the Te fraction increases, the electron concentration and the electrical conductivity of the samples increase, while the Hall mobility, the absolute Seebeck coefficient, and the thermal conductivity decrease. A maximum dimensionless figure of merit of 0.72 is obtained at 850 K for Co{sub 4}Sb{sub 11.5}Te{sub 0.5}.
- OSTI ID:
- 20719580
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 8 Vol. 98; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
ANNEALING
ANTIMONY ALLOYS
COBALT ALLOYS
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
ELECTRON DENSITY
HALL EFFECT
INTERMETALLIC COMPOUNDS
LATTICE PARAMETERS
MELTING
PLASMA
POLYCRYSTALS
SEEBECK EFFECT
SINTERING
TELLURIUM ALLOYS
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
THERMAL CONDUCTIVITY
THERMOELECTRIC PROPERTIES
X-RAY DIFFRACTION
ANNEALING
ANTIMONY ALLOYS
COBALT ALLOYS
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
ELECTRON DENSITY
HALL EFFECT
INTERMETALLIC COMPOUNDS
LATTICE PARAMETERS
MELTING
PLASMA
POLYCRYSTALS
SEEBECK EFFECT
SINTERING
TELLURIUM ALLOYS
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
THERMAL CONDUCTIVITY
THERMOELECTRIC PROPERTIES
X-RAY DIFFRACTION