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Title: RHEED and STM studies of the pseudo-tenfold surface of the {xi}{sup '}-Al{sub 77.5}Pd{sub 19}Mn{sub 3.5} approximant crystal

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics
;  [1];  [2]; ;  [3];  [1]
  1. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047 (Japan)
  2. LSG2M, CNRS-UMR7584, Ecole des Mines, Parc de Saurupt, 54042 Nancy (France)
  3. Department of Materials Science and Engineering, Ames Laboratory, Ames, Iowa 50011 (United States)

The pseudo-tenfold surface of the {xi}{sup '}-Al{sub 77.5}Pd{sub 19}Mn{sub 3.5} crystal, an approximant of the icosahedral Al-Pd-Mn quasicrystal, is investigated by reflection high-energy electron diffraction (RHEED) and scanning tunneling microscopy. The observed RHEED patterns of the surface after sputtering are found to be consistent with those of a simple cubic lattice with (110) surface plane. The [001] and [110] axes of the surface plane are oriented along the principal low-index axes of the bulk. The RHEED patterns of the sputter-annealed surface consist of diffraction streaks with periodic spacings expected for the bulk truncated surface. The surface prepared under different preparation methods is found to exhibit different step-height distribution and terrace morphology. A longer annealing yields a high density of shallow pentagonal pits on terraces, separated predominantly by 0.80-nm high steps and occasionally by double steps. In contrast, the surface prepared with shorter annealing time exhibits highly perfect terraces with 0.80-nm-high steps and additional unusual steps of heights close to 0.40 nm. All step heights observed for both preparation methods are consistent with interlayer spacings of the bulk model.

OSTI ID:
20719048
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Vol. 71, Issue 22; Other Information: DOI: 10.1103/PhysRevB.71.224201; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
Country of Publication:
United States
Language:
English