Inverse Fourier analysis in x-ray fluorescence holography

Journal Article · Wed Jun 01 00:00:00 EDT 2005 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.71.224104· OSTI ID:20719043

Hayashi, Kouichi ^[1]

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1. Institute for Materials Research, Tohoku University, Aoba-ku, Sendai 980-8577 (Japan)

X-ray fluorescence holography (XFH) is a promising tool for determing the local structures around specified elements. To obtain accurate interatomic distances, we applied inverse Fourier analysis, which has often been used to investigate extended x-ray absorption fine structures, to multiple energy x-ray holograms. The interatomic distances of neighboring atoms around a fluorescing atom were estimated from the 16 experimental holograms of a Au single crystal and most of them were in good agreement with the actual values within an error of 0.3%. The use of inverse Fourier analysis improves the XFH for the evaluation of quantitative local lattice distortion around impurities in single crystals.

• OSTI ID: 20719043
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Vol. 71, Issue 22; Other Information: DOI: 10.1103/PhysRevB.71.224104; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ATOMS
EMISSION SPECTRA
ERRORS
EVALUATION
FINE STRUCTURE
FLUORESCENCE
FOURIER ANALYSIS
GOLD
HOLOGRAPHY
IMPURITIES
INTERATOMIC DISTANCES
MONOCRYSTALS
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTRA