Crossover in growth exponent upon nanocrystallization of amorphous thin films
Journal Article
·
· Journal of Applied Physics
- Laboratory for Neutron Scattering, ETH Zuerich (Switzerland)
Thin films of Fe{sub 75}Zr{sub 25} alloy were deposited by cosputtering of Fe and Zr targets using magnetron sputtering technique in the thickness range of 7-85 nm. It was found that at a critical thickness of about 40 nm, nanocrystallization of initially deposited amorphous phase takes place. A crossover occurs in the growth exponent ({beta}) upon nanocrystallization giving a direct evidence for different growth behavior for amorphous and nanocrystalline phases.
- OSTI ID:
- 20714109
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 6 Vol. 98; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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