Evidence of a rearrangement of the surface structure in titanium phthalocyanine sensors induced by the interaction with nitrogen oxides molecules

Journal Article · Mon Oct 31 00:00:00 EST 2005 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2119429· OSTI ID:20706403

Generosi, A; Paci, B; Albertini, V Rossi; Perfetti, P; Paoletti, A M; Pennesi, G; Rossi, G; Caminiti, R ^[1]

---

1. Istituto di Struttura della Materia-Area di Ricerca di Tor Vergata, Via del Fosso del Cavaliere 100, 00133 Rome (Italy)

Thin-film samples of titanium phthalocyanine, a sensor of environmental pollutants, were studied by time resolved energy-dispersive x-ray reflectivity (EDXR). This original method demonstrated to be an ideal tool to follow the evolution of the films morphology upon gas exposure, in situ, also allowing an unexpected response of the sensors to be detected. Indeed, while the increase in thickness showed the characteristic feature of a 'breathing-like' expansion, already observed in other metal-Pc, the curve of roughness versus exposure time exhibited a peak. This effect, in some cases evident by observation with the naked eye the EDXR data, was attributed to a surface structure rearrangement process.

• OSTI ID: 20706403
• Journal Information: Applied Physics Letters, Vol. 87, Issue 18; Other Information: DOI: 10.1063/1.2119429; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CHEMICAL ANALYSIS
MORPHOLOGY
NITROGEN OXIDES
ORGANIC SEMICONDUCTORS
PHTHALOCYANINES
REFLECTIVITY
ROUGHNESS
THIN FILMS
TIME RESOLUTION
TITANIUM
TITANIUM COMPOUNDS
X RADIATION