Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

In situ High-Energy X-Ray Diffraction Study of the Local Structure of Supercooled Liquid Si

Journal Article · · Physical Review Letters
; ; ;  [1]; ; ;  [2];  [3];  [4];  [5]
  1. Department of Physics, Washington University, St. Louis, Missouri 63130 (United States)
  2. Ames Laboratory USDOE and Department of Physics and Astronomy, Iowa State University, Ames, Iowa, 50011 (United States)
  3. University of Massachusetts, Amherst, Massachusetts 01003 (United States)
  4. University of Alabama, Huntsville, Alabama 35899 (United States)
  5. NASA Marshall Space Flight Center, Huntsville, Alabama 35812 (United States)
Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.
OSTI ID:
20699327
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 8 Vol. 95; ISSN 0031-9007; ISSN PRLTAO
Country of Publication:
United States
Language:
English