Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

The impact of subcontinuum gas conduction on topography measurement sensitivity using heated atomic force microscope cantilevers

Journal Article · · Physics of Fluids (1994)
DOI:https://doi.org/10.1063/1.1932313· OSTI ID:20692956
; ;  [1]
  1. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0405 (United States)

Nanometer-scale topographical imaging using heated atomic force microscope (AFM) cantilevers, referred to here as thermal sensing AFM (TSAFM), is a promising technology for high resolution topographical imaging of nanostructured surfaces. Heated AFM cantilevers were developed for high-density data storage, where the heated cantilever tip can form and detect 20 nm indents made in a thermoplastic polymer. The scan height of the cantilever heater platform is typically near 500 nm, but could be made much smaller to improve reading sensitivity. Under atmospheric conditions the continuum models used in previous studies to model the gas phase heat transfer are invalid for the smallest operating heights. The present study uses a molecular model of subcontinuum heat transfer coupled with a finite difference simulation to predict the behavior of a TSAFM system. A direct simulation Monte Carlo model and a kinetic theory based macromodel are separately developed and used to model subcontinuum gas conduction. For the working gas (argon) the simple macromodel is found to be accurate and is used to predict cantilever operation. This systems-level modeling approach for TSAFM operation can aid data interpretation and seeks to improve microcantilever design.

OSTI ID:
20692956
Journal Information:
Physics of Fluids (1994), Journal Name: Physics of Fluids (1994) Journal Issue: 10 Vol. 17; ISSN 1070-6631; ISSN PHFLE6
Country of Publication:
United States
Language:
English

Similar Records

Topography imaging with a heated atomic force microscope cantilever in tapping mode
Journal Article · Sun Apr 15 00:00:00 EDT 2007 · Review of Scientific Instruments · OSTI ID:20953428

Characterization of piesoelectric ZnO thin films and the fabrication of piezoelectric micro-cantilevers
Thesis/Dissertation · Fri Dec 31 23:00:00 EST 2004 · OSTI ID:850081

Friction effects in the deflection of atomic force microscope cantilevers
Journal Article · Mon Jan 31 23:00:00 EST 1994 · Review of Scientific Instruments; (United States) · OSTI ID:5338903