Monitoring simultaneously the growth of nanoparticles and aggregates by in situ ultra-small-angle x-ray scattering

Journal Article · Tue Mar 01 04:00:00 EST 2005 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1855391· OSTI ID:20668229

Kammler, Hendrik K; Beaucage, Gregory; Kohls, Douglas J; Agashe, Nikhil; Ilavsky, Jan ^[1]

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1. Particle Technology Laboratory, Department of Mechanical and Process Engineering, ETH Zurich, ML F23, CH-8092 Zurich (Switzerland)

Ultra-small-angle x-ray scattering can provide information about primary particles and aggregates from a single scattering experiment. This technique is applied in situ to flame aerosol reactors for monitoring simultaneously the primary particle and aggregate growth dynamics of oxide nanoparticles in a flame. This was enabled through the use of a third generation synchrotron source (Advanced Photon Source, Argonne IL, USA) using specialized scattering instrumentation at the UNICAT facility which is capable of simultaneously measuring nanoscales to microscales (1 nm to 1 {mu}m). More specifically, the evolution of primary-particle diameter, mass-fractal dimension, geometric standard deviation, silica volume fraction, number concentration, radius of gyration of the aggregate, and number of primary particles per aggregate are measured along the flame axis for two different premixed flames. All these particle characteristics were derived from a single and nonintrusive measurement technique. Flame temperature profiles were measured in the presence of particles by in situ Fourier transform infrared spectroscopy and thermophoretic sampling was used to visualize particle growth with height above the burner as well as in the radial direction.

• OSTI ID: 20668229
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 5 Vol. 97; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AEROSOLS
CRYSTAL GROWTH
FOURIER TRANSFORM SPECTROMETERS
INFRARED SPECTRA
NANOSTRUCTURES
SILICA
SILICON COMPOUNDS
SMALL ANGLE SCATTERING
X-RAY DIFFRACTION