Ion species and electron behavior in capacitively coupled Ar and O{sub 2} plasma

Journal Article · Wed Dec 01 04:00:00 EST 2004 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1809253· OSTI ID:20658074

Seo, Hyungtak; Kim, Jung-Hyung; Shin, Yong-Hyeon; Chung, Kwang-Hwa ^[1]

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1. Center for Vacuum Technology, Korea Research Institute of Standards and Science, Daejeon 305-306 (Korea, Republic of)

We investigated the change in electron density using the plasma frequency by the wave cutoff method, and the behavior of ion species with a quadrupole mass spectrometer (QMS) in pure Ar and O{sub 2} and mixed O{sub 2}/Ar plasmas. The change in electron and ion density in pure Ar and O{sub 2} plasmas was evaluated while varying such process conditions as rf power and pressure. We found that electron density in a pure Ar and O{sub 2} discharge is closely correlated to loss and generation of ions. The electron densities in both pure Ar and O{sub 2} plasmas increase with rf plasma power but show different dependence on pressure due to different loss mechanism for each type of gas. The addition of Ar to an O{sub 2} plasma significantly enhances the electron density due to the rapid increase of Ar{sup +} ions regardless of the pressure. Also, Ar addition results in more dissociation of O{sub 2}, which gives more atomic O. These results indicate that the electron density calculated from the plasma frequency, measured by the wave cutoff method, is well explained by the ion behavior, as characterized by QMS.

• OSTI ID: 20658074
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 11 Vol. 96; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ARGON
ARGON IONS
DISSOCIATION
ELECTRON DENSITY
ELECTRONS
HIGH-FREQUENCY DISCHARGES
ION DENSITY
LANGMUIR FREQUENCY
MASS SPECTRA
MASS SPECTROMETERS
OXYGEN
PLASMA
PLASMA DENSITY
QUADRUPOLES