Reconstruction of Flaw Profiles Using Neural Networks and Multi-Frequency Eddy Current System
Journal Article
·
· AIP Conference Proceedings
- Technical University of Szczecin, al. Piastow 19, 70-310 Szczecin (Poland)
The objective of this paper is to identify profiles of flaws in conducting plates. To solve this problem, application of a multi-frequency eddy current system (MFES) and artificial neural networks is proposed. Dynamic feed-forward neural networks with various architectures are investigated. Extended experiments with all neural models are carried out in order to select the most promising configuration. Data utilized for the experiments were obtained from the measurements performed on the Inconel plates with EDM flaws.
- OSTI ID:
- 20655393
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 760; ISSN 0094-243X; ISSN APCPCS
- Country of Publication:
- United States
- Language:
- English
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