Eddy Current Nondestructive Residual Stress Assessment in Shot-Peened Nickel-Base Superalloys
- Metals, Ceramics, and NDE Division, AFRL, Wright-Patterson Air Force Base, Dayton, Ohio 45432 (United States)
- Department of Aerospace Engineering and Engineering Mechanics, University of Cincinnati, Cincinnati, Ohio 45221 (United States)
Shot peening and other mechanical surface enhancement methods improve the fatigue resistance and foreign-object damage tolerance of metallic components by introducing beneficial near-surface compressive residual stresses and hardening the surface. However, the fatigue life improvement gained via surface enhancement is not explicitly accounted for in current engine component life prediction models because of the lack of accurate and reliable nondestructive methods that could verify the presence of compressive near-surface residual stresses in shot-peened hardware. In light of its frequency-dependent penetration depth, the measurement of eddy current conductivity has been suggested as a possible means to allow the nondestructive evaluation of subsurface residual stresses in surface-treated components. This technique is based on the so-called piezoresistivity effect, i.e., the stress-dependence of electrical resistivity. We found that, in contrast with most other materials, surface-treated nickel-base superalloys exhibit an apparent increase in electrical conductivity at increasing inspection frequencies, i.e., at decreasing penetration depths. Experimental results are presented to illustrate that the excess frequency-dependent apparent eddy current conductivity of shot-peened nickel-base superalloys can be used to estimate the absolute level and penetration depth of the compressive residual stress layer both before and after partial thermal relaxation.
- OSTI ID:
- 20655339
- Journal Information:
- AIP Conference Proceedings, Vol. 760, Issue 1; Conference: Conference on review of progress in quantitative nondestructive evaluation, Golden, CO (United States), 25-30 Jul 2004; Other Information: DOI: 10.1063/1.1916828; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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