Laser line shape and spectral density of frequency noise

Journal Article · Fri Apr 01 04:00:00 EST 2005 · Physical Review. A

DOI:https://doi.org/10.1103/PhysRevA.71.043809· OSTI ID:20653348

Stephan, G M; Blin, S; Besnard, P ^[1]; Tam, T T ^[2]; Tetu, M ^[3]

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1. Laboratoire d'Optronique associe au Centre National de la Recherche Scientifique, ENSSAT, 6 rue Kerampont, 22305 Lannion Cedex (France)
2. College of Applied Science and Technology, Vietnam National University, Hanoi (VNUH), 144 Xuan Thuy str., Building E3, Caugiay, Hanoi (Viet Nam)
3. DiCOS Technologies, Boul. du Parc Technologique, Bureau 200, Quebec, G1K 7P4 (Canada)

Published experimental results show that single-mode laser light is characterized in the microwave range by a frequency noise which essentially includes a white part and a 1/f (flicker) part. We theoretically show that the spectral density (the line shape) which is compatible with these results is a Voigt profile whose Lorentzian part or homogeneous component is linked to the white noise and the Gaussian part to the 1/f noise. We measure semiconductor laser line profiles and verify that they can be fit with Voigt functions. It is also verified that the width of the Lorentzian part varies like 1/P where P is the laser power while the width of the Gaussian part is more of a constant. Finally, we theoretically show from first principles that laser line shapes are also described by Voigt functions where the Lorentzian part is the laser Airy function and the Gaussian part originates from population noise.

• OSTI ID: 20653348
• Journal Information: Physical Review. A, Journal Name: Physical Review. A Journal Issue: 4 Vol. 71; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
AIRY FUNCTIONS
ENERGY LEVELS
LASER RADIATION
LEVEL WIDTHS
NOISE
SEMICONDUCTOR LASERS
SPECTRAL DENSITY
VISIBLE RADIATION