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Buffer Layer R and D for YBCO Coated Conductor Composite Wires

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.1774625· OSTI ID:20653230
; ; ; ; ; ; ;  [1]; ; ; ; ; ; ;  [2];  [3]
  1. Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
  2. American Superconductor Corporation, Westborough, MA 01581 (United States)
  3. 3M Company, St. Paul, MN 55144 (United States)
Buffer layers play a key role in the YBa2Cu3O7-{delta} (YBCO) coated conductor composite wire technology. The important buffer layer characteristics are: these buffers should prevent metal diffusion into the superconductor from the substrate; possibly act as oxygen diffusion barriers; should be smooth, continuous, crack-free, highly aligned and dense. In order to develop low-cost alternative buffer layer architectures to the standard architecture of YBCO/CeO2/YSZ/Y2O3/Ni/Ni-W, LaMnO3 (LMO) and La2Zr2O7 (LZO) buffers were chosen for this study. These buffers were grown epitaxially on biaxially textured and strengthened Ni-W3% metal tapes by scalable vapor and/or solution techniques. LaMnO3 buffers were grown epitaxially on Ni-W substrates by rf sputtering, and La2Zr2O7 buffers were grown by a Metal-Organic Deposition (MOD). Detailed microstructural characterizations indicate that both of these buffers were excellent Ni diffusion barrier layers and high current YBCO films were grown on both LMO and LZO buffer templates.
OSTI ID:
20653230
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 711; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English