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Development of Multilayer Analyzer Array Detectors for X-ray Fluorescence at the Third Generation Synchrotron Source

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.1757955· OSTI ID:20653115
 [1];  [2];  [3];  [4];  [5];  [1];  [6]
  1. Illinois Institute of Technology, Chicago, IL (United States)
  2. SERCAT, University of Georgia, Athens, GA (United States)
  3. HD Technologies, Inc. Darien, IL (United States)
  4. Advanced Photon Source, Argonne National Laboratory, Argonne, IL (United States)
  5. Department of Biochemistry Tel Aviv University, Tel Aviv G9978 (Israel)
  6. National Institute of Standard and Technology, Gaithersburg, MD (United States)
+ Show Author Affiliations

The development of Multilayer Analyzer Array Detector (MAAD) for X-ray fluorescence eliminates the count rate limitation encountered with multi-element Ge detectors. A 24-element multilayer detector has been fabricated that is tunable in a large energy region. This detector has been operational for more than two years at the BioCAT Beamline of the Advanced Photon Source at Argonne National Laboratory. Here we report our recent progress in developing multilayer detectors working in lower energy regions, in particular, performance at Ca K{alpha} fluorescence energy and test results at soft x-ray energies. The band width of the analyzer response is found to be 3-4% of the fluorescence energy. Namely, at the Ca K{alpha} energy, the band width is 140 eV; it is reduced to about 60 eV at Al K{alpha} fluorescence energy. The throughput of the detector in this energy region (1.5-3.6 KeV) is 20% to 30%. These results demonstrate the feasibility for constructing multilayer analyzer array detectors for use in the soft x-ray region.

OSTI ID:
20653115
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 705; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

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Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION SPECTROSCOPY
ADVANCED PHOTON SOURCE
ALUMINIUM
ANL
CALCIUM
COUNTING RATES
DATA ACQUISITION
EV RANGE 10-100
EV RANGE 100-1000
FLUORESCENCE
GE SEMICONDUCTOR DETECTORS
KEV RANGE 01-10
PERFORMANCE
SOFT X RADIATION
SYNCHROTRON RADIATION
X-RAY DETECTION
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTROSCOPY