Versatile USAXS (Bonse-Hart) Facility for Advanced Materials Research

Journal Article · Wed May 12 04:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757846· OSTI ID:20652995

Ilavsky, Jan ^[1]; Jemian, Pete ^[2]; Allen, Andrew J; Long, Gabrielle G ^[2]

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1. School of Chemical Engineering, Purdue University, West Lafayette, IN 47907 (United States)
2. Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899 (United States)

The USAXS facility at UNICAT Sector 33 at the Advanced Photon Source (APS) is a world-class resource for advanced materials research emphasizing full-range characterization of nanometer-scale to micrometer-scale microstructures. Receiving photons from an APS Undulator A X-ray source, the instrument delivers {approx_equal} 1013 ph s-1 incident in a 0.4 mm x 2.5 mm area at the sample position for 10 keV photons, has an incident photon energy range from 7 keV to 19 keV, a single-scan Q range (where Q = 4{pi}/{lambda} sin {theta}, {lambda} is the photon wavelength, and 2{theta} is the angle of scatter) from 0.0001 A-1 to 1 A-1, over 10 decades of detector intensity range, absolute intensity calibration by primary methods, fluorescence rejection in the scattered beam, excellent energy resolution ({delta}{lambda}/{lambda}) for anomalous USAXS, and a maximum unfocused beam size of 0.4 mm x 2.5 mm, with useful beams as small as 20 {mu}m x 20 {mu}m. The facility offers semi-automated data reduction, rapid and rigorous data analysis using state-of-the-art structure factors and models, and radiographic and USAXS-imaging. Both 1-D collimated (slit-smeared configuration) and 2-D collimated configurations are routinely available. Ongoing development of this facility continues in an active partnership between the instrument scientists and the user community.

• OSTI ID: 20652995
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 705; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED PHOTON SOURCE
BEAM OPTICS
CALIBRATION
CHEMICAL ANALYSIS
CRYSTALLOGRAPHY
CYCLIC ACCELERATORS
DATA ANALYSIS
ENERGY RESOLUTION
FLUORESCENCE
KEV RANGE 01-10
KEV RANGE 10-100
MICROSTRUCTURE
PHOTON BEAMS
PHOTONS
STRUCTURE FACTORS
SYNCHROTRON RADIATION
X RADIATION
X-RAY SOURCES