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Title: The Analyzer System for Diffraction Enhanced Imaging at the ELETTRA Synchrotron Facility

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.1758050· OSTI ID:20652877
;  [1]; ;  [2]
  1. Department of Physics, University of Trieste (Italy) and INFN (Italy)
  2. Societa Sincrotrone Trieste SCpA (Italy)

At the medical imaging beamline SYRMEP under operation at the synchrotron radiation facility ELETTRA (Trieste, Italy) an analyzer system has been implemented to perform Diffraction Enhanced Imaging (DEI), a powerful phase-based technique. The bending magnet beamline comprises a double-crystal Si[111] monochromator system and operates in an energy range between 8.5 and 35 keV. In most of the experiments a Si[111] single-crystal in Bragg mode is used as an analyzer. When required the system can also exploit the Si[333] reflection in order to achieve a higher angular sensitivity, consequently enhancing extinction and refraction contrasts. Recently the system was upgraded to a double-crystal configuration that provides a fixed exit beam at different energies. Further improvements in angular sensitivity and system stability were obtained. Experiments to evaluate the associated improvements in image quality were carried out on specially designed phase phantoms and biological samples proving that DEI is an appropriate tool for studying refraction and scattering properties.

OSTI ID:
20652877
Journal Information:
AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1758050; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English