Application of X-ray Refraction-Contrast to Medical Joint Imaging

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1758045· OSTI ID:20652871

Shimao, Daisuke ^[1]; Mori, Koichi ^[2]; Hyodo, Kazuyuki ^[3]; Sugiyama, Hiroshi ^[1]; Ando, Masami ^[1]

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1. Department of Material Structural Sciences, School of Mathematical and Physical Science, Graduate University for Advanced Studies, Oho 1-1, Tsukuba, Ibaraki 305-0801 (Japan)
2. Department of Radiological Sciences, Ibaraki Prefectural University of Health Sciences, Ami 4669-2, Inashiki, Ibaraki 300-0394 (Japan)
3. Photon Factory, Institute of Materials Structure Sciences, High Energy Accelerator Research Organization, Oho 1-1, Tsukuba, Ibaraki 305-0801 (Japan)

The refraction-contrast X-ray imaging technique using synchrotron X-ray has been applied to an 8 mm sliced distal end of a human femur involving ligament and articular cartilage at 15 keV. It was shown that this technique can clearly depict the fine structures of the ligament, its torn surface and substantial articular cartilage at near the just Bragg angular position. The entrance surface dose necessary for each image was approximately 4 mGy by using an imaging plate. This imaging technique may become a powerful tool for depicting abnormalities of the ligament and articular cartilage.

• OSTI ID: 20652871
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1758045; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CARTILAGE
FEMUR
FINE STRUCTURE
IMAGES
KEV RANGE 10-100
LIGAMENTS
MAN
PLATES
REFRACTION
RESOLUTION
SURFACES
SYNCHROTRON RADIATION
SYNCHROTRONS
X RADIATION
X-RAY DIFFRACTION