Surface And Interface Studies At APS Endstation 5ID-C

Journal Article · Wed May 12 04:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1758007· OSTI ID:20652832

Walko, D A; Sakata, O; Lyman, P F; Lee, T -L; Tinkham, B P; Okasinski, J S; Zhang, Z; Bedzyk, M J ^[1]

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1. Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208 (United States)

We have instrumented the 5ID-C hutch of DND-CAT at the Advanced Photon Source (APS) for x-ray surface spectroscopy and scattering. A wide variety of experiments have already been carried out at 5ID-C, including studies on semiconductors, oxides, metals, nanodots, and biomolecular adsorption. We describe the beamline optics, data collection hardware and software, and both diffractometers, a five-circle kappa diffractometer for open-air and liquid-cell experiments, and a psi-circle diffractometer with an integrated ultrahigh vacuum (UHV) chamber, paying particular attention to the requirements of an XSW measurement.

• OSTI ID: 20652832
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 705; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ADSORPTION
ADVANCED PHOTON SOURCE
COMPUTER CODES
DATA ACQUISITION
DIFFRACTOMETERS
EQUIPMENT
INTERFACES
METALS
OPTICS
OXIDES
QUANTUM DOTS
SEMICONDUCTOR MATERIALS
SURFACE PROPERTIES
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY