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Title: Spatially resolved bolometric measurement and electron temperature measurement using diode arrays

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1787899· OSTI ID:20641216
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  1. National Institute of Advanced Industrial Science and Technology, 1-1-1 Tsukuba 305-8568 (Japan)

In this article, the measurement system for the total radiation and electron temperature profiles to be installed in a reversed-field pinch machine, toroidal pinch experiment, RX [TPE-RX, R/a=1.72/0.45 m, Ip<MA (designed)], is presented. We plan to measure the plasma radiation and electron temperature profiles using three sets of diode arrays. Each array can measure radiation along 20 lines of sight and the radial profile of the radiation. One set of the arrays is used for the bolometric measurement in the range from visible light to soft x-ray. Two sets of the arrays are used for the soft-x ray and electron temperature measurements employing a double-filter method. We will use this system to investigate the plasma-wall interaction, radiation loss, and confinement properties in the core plasma region. We will extend the use of this system for tomographic analysis of electron temperature, a concept of which is also presented.

OSTI ID:
20641216
Journal Information:
Review of Scientific Instruments, Vol. 75, Issue 10; Conference: 15. topical conference on high temperature plasma diagnostics, San Diego, CA (United States), 19-22 Apr 2004; Other Information: DOI: 10.1063/1.1787899; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English