Precision cutting of nanotubes with a low-energy electron beam

Journal Article · Mon Jan 31 00:00:00 EST 2005 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1857081· OSTI ID:20637004

Yuzvinsky, T D; Fennimore, A M; Mickelson, W; Esquivias, C; Zettl, A ^[1]

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1. Department of Physics, University of California at Berkeley, and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)

We report on a method to locally remove material from carbon and boron nitride nanotubes using the low-energy focused electron beam of a scanning electron microscope. Using this method, clean precise cuts can be made into nanotubes, either part-way through (creating hingelike geometries) or fully through (creating size-selected nanotube segments). This cutting mechanism involves foreign molecular species and differs from electron-beam-induced knock-on damage in transmission electron microscopy.

• OSTI ID: 20637004
• Journal Information: Applied Physics Letters, Vol. 86, Issue 5; Other Information: DOI: 10.1063/1.1857081; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ACCURACY
BORON NITRIDES
CARBON
CUTTING
ELECTRON BEAMS
NANOTUBES
SCANNING ELECTRON MICROSCOPY
TRANSMISSION ELECTRON MICROSCOPY