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X-ray spectroscopy with elliptical crystals and face-on framing cameras

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1788873· OSTI ID:20636745
; ; ; ; ;  [1]
  1. Lawrence Livermore National Laboratory, P. O. Box 808, L-472, Livermore, California 94551 (United States)

X-ray spectrometers using elliptically bent crystals have desirable properties for applications requiring broad spectral coverage, good spectral resolution, and minimized source broadening. Previous work used custom-positioned film or microchannel plate detectors. We find it is also useful and cost-effective to field elliptical crystals in existing snouts on the face-on gated microchannel plate framing cameras commonly used at many facilities. We numerically explored the full design space (spectral range and resolution) of elliptical crystals compatible with the new multipurpose spectrometer snout. We have tested at the Omega laser an elliptical rubidium acid phthalate crystal with 174 mm focal length, 0.9885 eccentricity, and 4.6 deg. inclination, viewing from 1.0 to at least 1.7 keV with spectral resolution E/dE of 300-500. A slit (2xmagnification) images 3 mm sources with 70 {mu}m spatial resolution.

OSTI ID:
20636745
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 75; ISSN 0034-6748; ISSN RSINAK
Country of Publication:
United States
Language:
English

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