Measurement of ion temperature and density profiles with a time-of-flight type neutral-particle analyzer

Journal Article · Fri Oct 01 00:00:00 EDT 2004 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1785265· OSTI ID:20636708

Ichimura, M; Higaki, H; Kawabata, T; Inoue, D; Nagai, H; Kakimoto, S; Yamaguchi, Y; Horinouchi, K; Ide, K; Nakagome, K; Cho, T ^[1]

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1. Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577 (Japan)

High beta plasmas in the anchor cell of the GAMMA 10 tandem mirror are formed by using a fundamental ion cyclotron resonance heating. Because the closed resonance surface exists near the midplane of the anchor cell, strongly peaked profile of the plasma pressure will be formed. To measure the axial profiles of the ion temperature and density, a time-of-flight type neutral-particle analyzer (TOF-NPA) has been developed. TOF-NPA can detect neutral particles and photons separately at the same time. The ion temperature and density have been evaluated from the particle and photon signals, respectively. The peaked profile of the ion temperature within the closed resonance surface has been confirmed.

• OSTI ID: 20636708
• Journal Information: Review of Scientific Instruments, Vol. 75, Issue 10; Other Information: DOI: 10.1063/1.1785265; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ELECTRON TEMPERATURE
GAMMA 10 DEVICES
HIGH-BETA PLASMA
ICR HEATING
ION DENSITY
ION TEMPERATURE
NEUTRAL PARTICLE ANALYZERS
NEUTRAL PARTICLES
PLASMA DENSITY
PLASMA DIAGNOSTICS
PLASMA PRESSURE
RF SYSTEMS
TIME-OF-FLIGHT METHOD