Radiation hardness of pn-CCDs for X-ray astronomy
- Max-Planck-Inst. fuer Extraterrestrische Physik, Garching (Germany)
- KETEK GmbH, Oberschleissheim (Germany)
Results of an extensive radiation hardness test of a full depletion pn-Charge Coupled Device (pn-CCD) detector are presented. The pn-CCD is a new type of Charge Coupled Device designed for X-ray spectroscopy in ESA`s cornerstone X-ray Multi Mirror (XMM) satellite mission. The devices were irradiated with 10 MeV-protons with fluences up to 6.5 {center_dot} 10{sup 9} cm{sup {minus}2}. This is more than one order of magnitude higher than the equivalent proton radiation environment expected for the 10 year mission. The only effect to the device was a degradation of charge transfer efficiency (CTE) at temperatures around 120K. At XMM`s operating temperature between 140K and 170K the performance of the detector will not significantly change during the 10 year mission. The degradation of the CTE was studied, and a method to improve it is described.
- OSTI ID:
- 203732
- Report Number(s):
- CONF-950716--
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 42; ISSN IETNAE; ISSN 0018-9499
- Country of Publication:
- United States
- Language:
- English
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