Microstructures and dielectric properties of ferroelectric glass-ceramics

Journal Article · Mon Jan 01 04:00:00 EST 1996 · Journal of the American Ceramic Society

DOI:https://doi.org/10.1111/j.1151-2916.1996.tb07875.x· OSTI ID:203535

Reece, M J ^[1]; Worrell, C A ^[2]; Hill, G J ^[3]; Morrell, R ^[4]

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1. Queen Mary and Westfield Coll., London (United Kingdom)
2. Univ. of Sussex (United Kingdom)
3. ERA Technology, Leatherhead (United Kingdom)
4. National Physical Lab., Teddington (United Kingdom)

The microstructures of ferroelectric glass-ceramics derived from (Pb,Sr,Ba)Nb{sub 2}O{sub 6} solid solutions have been investigated systematically using electron microscopy (TEM, SEM) and X-ray diffraction (XRD). These data, together with the measured dielectric properties of the materials have been correlated with both the sintering/devitrification conditions and compositional changes to the base glass. The low incidence of ferroelectric domains suggests that an increase in permittivity results from an increase in internal stress during grain growth. These domains were observed only a few tetragonal structured crystals with grain sizes > 1 {micro}m. Their compositions were typically Sr-rich and Ba-depleted. For a given devitrification/crystallization temperature, the grain compositions and sizes are affected significantly by relatively minor compositional changes to the base glass network formers. The diffuse temperature dependence of permittivity is attributed to the fine-grain (submicrometer) microstructures and the compositional range of solid solutions which arise during devitrification.

• Sponsoring Organization: USDOE
• OSTI ID: 203535
• Journal Information: Journal of the American Ceramic Society, Journal Name: Journal of the American Ceramic Society Journal Issue: 1 Vol. 79; ISSN 0002-7820; ISSN JACTAW
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM OXIDES
BARIUM OXIDES
BORON OXIDES
COMPOSITE MATERIALS
CORRELATIONS
CRYSTALLIZATION
DIELECTRIC PROPERTIES
FABRICATION
FERROELECTRIC MATERIALS
HEAT TREATMENTS
HOT PRESSING
LEAD OXIDES
MICROSTRUCTURE
NIOBIUM OXIDES
PERMITTIVITY
SCANNING ELECTRON MICROSCOPY
SILICON OXIDES
SINTERING
SOLID SOLUTIONS
STRONTIUM OXIDES
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION