Fast imaging of hard x rays with a laboratory microscope

Journal Article · Sat Jul 01 04:00:00 EDT 2000 · Applied Optics

DOI:https://doi.org/10.1364/AO.39.003333· OSTI ID:20217573

Bakulin, Alex S ^[1]; Durbin, Stephen M ^[1]; Jach, Terrence ^[2]; Pedulla, Joseph ^[3]

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1. Department of Physics, West Lafayette, Indiana 47907-1396 (United States)
2. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
3. J. Pedulla Associates, Silver Spring, Maryland 20906 (United States)

An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x rays. It uses the Kirkpatric-Baez multilayer mirror design to form an image that has a demonstrated resolution of 4 {mu}m at 8 keV (Cu K{sub {alpha}} radiation). This microscope performs well with standard sealed-tube laboratory x-ray sources, producing digital images with 20-s exposure times for a 5-{mu}m Au grid (a thickness of two absorption lengths). (c) 2000 Optical Society of America.

• OSTI ID: 20217573
• Journal Information: Applied Optics, Journal Name: Applied Optics Journal Issue: 19 Vol. 39; ISSN 0003-6935; ISSN APOPAI
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGE-COUPLED DEVICES
DIGITAL SYSTEMS
EXPERIMENTAL DATA
IMAGE PROCESSING
SPATIAL RESOLUTION
X-RAY EQUIPMENT