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Title: Neutron reflectometry as a tool to study magnetism (invited)

Abstract

Polarized-neutron specular reflectometry (PNR) was developed in the 1980's as a means of measuring magnetic depth profiles in flat films. Starting from simple profiles, and gradually solving structures of greater complexity, PNR has been used to observe or clarify a variety of magnetic phenomena. It has been used to measure the absolute magnetization of films of thickness not exceeding a few atomic planes, the penetration of magnetic fields in micron-thick superconductors, and the detailed magnetic coupling across nonmagnetic spacers in multilayers and superlattices. The development of new scattering techniques promises to enable the characterization of lateral magnetic structures. Retaining the depth sensitivity of specular reflectivity, off-specular reflectivity may be brought to resolve in-plane structures over nanometer to micron length scales. (c) 2000 American Institute of Physics.

Authors:
 [1]
  1. Material Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Publication Date:
OSTI Identifier:
20216233
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 87; Journal Issue: 9; Other Information: PBD: 1 May 2000; Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; NEUTRON DIFFRACTION; REFLECTION; THIN FILMS; MAGNETISM; SUPERLATTICES; MEASURING METHODS; EXPERIMENTAL DATA

Citation Formats

Felcher, G. P. Neutron reflectometry as a tool to study magnetism (invited). United States: N. p., 2000. Web. doi:10.1063/1.373365.
Felcher, G. P. Neutron reflectometry as a tool to study magnetism (invited). United States. doi:10.1063/1.373365.
Felcher, G. P. Mon . "Neutron reflectometry as a tool to study magnetism (invited)". United States. doi:10.1063/1.373365.
@article{osti_20216233,
title = {Neutron reflectometry as a tool to study magnetism (invited)},
author = {Felcher, G. P.},
abstractNote = {Polarized-neutron specular reflectometry (PNR) was developed in the 1980's as a means of measuring magnetic depth profiles in flat films. Starting from simple profiles, and gradually solving structures of greater complexity, PNR has been used to observe or clarify a variety of magnetic phenomena. It has been used to measure the absolute magnetization of films of thickness not exceeding a few atomic planes, the penetration of magnetic fields in micron-thick superconductors, and the detailed magnetic coupling across nonmagnetic spacers in multilayers and superlattices. The development of new scattering techniques promises to enable the characterization of lateral magnetic structures. Retaining the depth sensitivity of specular reflectivity, off-specular reflectivity may be brought to resolve in-plane structures over nanometer to micron length scales. (c) 2000 American Institute of Physics.},
doi = {10.1063/1.373365},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 9,
volume = 87,
place = {United States},
year = {2000},
month = {5}
}