Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Comparison of Kretschmann-Raether angular regimes for measuring changes in bulk refractive index

Journal Article · · Applied Optics
DOI:https://doi.org/10.1364/AO.39.000061· OSTI ID:20215786
 [1]
  1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)

We compare two angular regimes for the measurement of changes in the real refractive index of bulk fluid analytes. The measurements are based on the use of the Kretschmann-Raether configuration to sense a change in reflectivity with index. Specifically, we numerically simulate the relative sensitivities of the total internal reflection (TIR) and the surface-plasmon resonance (SPR) regimes. For a fixed-angle apparatus, the method that gives the greatest change in reflectivity varies with metal film thickness. For films thicker than the skin depth, the SPR regime is the most sensitive to index changes. For thinner films, however, the TIR angle is then dominant, with increases in sensitivity on the order of 75% for 10-nm gold or silver media. (c) 2000 Optical Society of America.

OSTI ID:
20215786
Journal Information:
Applied Optics, Journal Name: Applied Optics Journal Issue: 1 Vol. 39; ISSN 0003-6935; ISSN APOPAI
Country of Publication:
United States
Language:
English

Similar Records

A Comparison of Kretschmann-Raether Angular Regimes for Measuring Changes in Bulk Refractive Index
Journal Article · Thu Sep 16 00:00:00 EDT 1999 · Applied Optics · OSTI ID:12677

When are Surface Plasmon Polaritons Excited in the Kretschmann-Raether Configuration?
Journal Article · Thu Apr 23 00:00:00 EDT 2015 · Scientific Reports · OSTI ID:1392069

When are surface plasmon polaritons excited in the Kretschmann-Raether configuration?
Journal Article · Thu Apr 23 00:00:00 EDT 2015 · Scientific Reports · OSTI ID:1200853