Li ion diffusion measurements in crystalline and amorphous V{sub 2}O{sub 5} thin-film battery cathodes

Conference · Sat Jul 01 00:00:00 EDT 2000

OSTI ID:20086871

McGraw, J M; Bahn, C S; Parilla, P A; Perkins, J D; Readey, D W; Ginley, D S

Thin films of crystalline and amorphous V{sub 2}O{sub 5} were deposited by pulsed laser deposition (PLD) and the chemical diffusion coefficients, {tilde D}, were measured by the potentiostatic intermittent titration technique (PITT). In crystalline V{sub 2}O{sub 5} films, the maximum and minimum {tilde D} were found to be 1.7 x 10{sup {minus}12} cm{sup 2}/s and 5.8 x 10{sup {minus}15} cm{sup 2}/s respectively, with a general trend for {tilde D} to rise in single-phase regions. The changes in {tilde D} correlated well to the known phases in Li{sub x}V{sub 2}O{sub 5}. In amorphous V{sub 2}O{sub 5} films, {tilde D} exhibited a smooth, continuous decrease as the Li concentration increased.

• Research Organization: National Renewable Energy Lab., Golden, CO (US)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC36-83CH10093
• OSTI ID: 20086871
• Resource Relation: Conference: 1999 Materials Research Society Spring Meeting, San Francisco, CA (US), 04/05/1999--04/08/1999; Other Information: PBD: 2000; Related Information: In: New materials for batteries and fuel cells. Materials Research Society symposium proceedings, Volume 575, by Doughty, D.H.; Nazar, L.F.; Arakawa, Masayasu; Brack, H.P.; Naoi, Katsuhiko [eds.], 454 pages.
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
25 ENERGY STORAGE
VANADIUM OXIDES
PHYSICAL VAPOR DEPOSITION
CRYSTAL STRUCTURE
AMORPHOUS STATE
DIFFUSION
METAL-NONMETAL BATTERIES
CATHODES
ELECTRICAL PROPERTIES