At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals

Shi, Xianbo; Qiao, Zhi; Pradhan, Paresh; Liu, Peifan; Assoufid, Lahsen; Kim, Kwang-Je; Shvyd'ko, Yuri

doi:10.1107/S1600577523007531

At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals

Journal Article · Tue Oct 10 00:00:00 EDT 2023 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/S1600577523007531· OSTI ID:2008382

; Qiao, Zhi; Pradhan, Paresh; ; Assoufid, Lahsen; ; Shvyd'ko, Yuri

The advent of next-generation synchrotron radiation sources and X-ray free-electron lasers calls for high-quality Bragg-diffraction crystal optics to preserve the X-ray beam coherence and wavefront. This requirement brings new challenges in characterizing crystals in Bragg diffraction in terms of Bragg-plane height errors and wavefront phase distortions. Here, a quantitative methodology to characterize crystal optics using a state-of-the-art at-wavelength wavefront sensing technique and statistical analysis is proposed. The method was tested at the 1-BM-B optics testing beamline at the Advanced Photon Source for measuring silicon and diamond crystals in a self-referencing single-crystal mode and an absolute double-crystal mode. The phase error sensitivity of the technique is demonstrated to be at the λ/100 level required by most applications, such as the characterization of diamond crystals for cavity-based X-ray free-electron lasers.

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Sponsoring Organization:: USDOE

Grant/Contract Number:: NONE; AC02-06CH11357

OSTI ID:: 2008382

Alternate ID(s):: OSTI ID: 2469513

Journal Information:: Journal of Synchrotron Radiation (Online), Journal Name: Journal of Synchrotron Radiation (Online) Journal Issue: 6 Vol. 30; ISSN 1600-5775; ISSN JSYRES

Publisher:: International Union of Crystallography (IUCr)Copyright Statement

Country of Publication:: Denmark

Language:: English

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