Crystallographic properties of I{sub 2}-Fe-IV-VI{sub 4} magnetic semiconductor compounds
X-ray powder diffraction measurements were made at room temperature on sixteen polycrystalline samples of I{sub 2}-Fe-IV-VI{sub 4} (I: Cu, Ag; IV: Si, Ge, Sn, Pb; VI: Se, Te) magnetic semiconductor compounds. The diffraction patterns were analyzed to determine values of lattice parameter for each compound. The results showed that Cu{sub 2}FeSiSe{sub 4}, Cu{sub 2}FeGeSe{sub 4} and Cu{sub 2}FeSnSe{sub 4} have the tetragonal stannite structure (I{bar 4}2m), while the rest of the materials have an orthorhombic superstructure of quartzite which is known as wurtz-stannite (Pmn2{sub 1}). It was found that, when the values of the effective parameter a{sub e} = (V/N){sup 1/3} are plotted against the molecular weight W of the materials, the tetragonal and orthorhombic compounds lie on different straight lines. In addition, differential thermal analysis (DTA) measurements were made, and the peaks on the DTA cooling curves were used to determine values corresponding to the melting temperature for the compounds.
- Research Organization:
- Univ. de Los Andes, Merida (VE)
- OSTI ID:
- 20075663
- Journal Information:
- Materials Research Bulletin, Vol. 34, Issue 14-15; Other Information: PBD: Nov-Dec 1999; ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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