Towards linking lab and field lifetimes of perovskite solar cells

Jiang, Qi; Tirawat, Robert; Kerner, Ross A.; Gaulding, E. Ashley; Xian, Yeming; Wang, Xiaoming; Newkirk, Jimmy M.; Yan, Yanfa; Berry, Joseph J.; Zhu, Kai

doi:10.1038/s41586-023-06610-7

Towards linking lab and field lifetimes of perovskite solar cells

Journal Article · Mon Sep 11 04:00:00 EDT 2023 · Nature (London)

DOI:https://doi.org/10.1038/s41586-023-06610-7· OSTI ID:2005598

Jiang, Qi ^[1]; ^[1]; Kerner, Ross A. ^[1]; ^[2]; Xian, Yeming ^[3]; ^[3]; Newkirk, Jimmy M. ^[2]; ^[3]; ^[4]; ^[1]

National Renewable Energy Laboratory (NREL), Golden, CO (United States). Chemistry and Nanoscience Center
National Renewable Energy Laboratory (NREL), Golden, CO (United States). Materials Science Center
Univ. of Toledo, OH (United States). Wright Center for Photovoltaics Innovation and Commercialization (PVIC)
National Renewable Energy Laboratory (NREL), Golden, CO (United States). Materials Science Center; Univ. of Colorado, Boulder, CO (United States). Renewable and Sustainable Energy Institute (RSEI)

Metal halide perovskite solar cells (PSCs) represent a promising low-cost, thin-film photovoltaic (PV) technology, with unprecedented power conversion efficiencies (PCEs) obtained for both single-junction and tandem applications. To push PSCs toward commercialization, it is critical, albeit challenging, to understand device reliability under real-world outdoor conditions where multiple stress factors (e.g., light, heat, humidity) coexist, generating complicated degradation behaviors. It is necessary to identify accelerated indoor testing protocols - which can correlate specific stressors with observed degradation modes in fielded devices - to quickly guide PSC development. Here, we use a state-of-the-art p-i-n PSC stack (with PCE up to ~25.5%) to show that indoor accelerated stability tests can predict our 6-month outdoor aging tests. Device degradation rates under illumination and at elevated temperatures are most instructive for understanding outdoor device reliability. Further, we also find that the indium tin oxide (ITO)/self-assembled monolayer (SAM)-based hole transport layer (HTL)/perovskite interface most strongly affects our device operation stability. Improving the ion-blocking properties of the SAM HTL increases averaged device operational stability at 50 degree C-85 °C by a factor of ~2.8, reaching over 1000 h at 85 °C and to near 8200 h at 50 °C with a projected 20% degradation, which is among the best to date for high-efficiency p-i-n PSCs.

View Accepted Manuscript (DOE)

Research Organization:: National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office; USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC36-08GO28308; EE0008790; AC02-05CH11231

OSTI ID:: 2005598

Report Number(s):: NREL/JA-5900-87287; MainId:88062; UUID:83c536af-adfe-4b93-9aab-68a21e181971; MainAdminID:70758

Journal Information:: Nature (London), Journal Name: Nature (London) Journal Issue: 7986 Vol. 623; ISSN 0028-0836

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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