Opportunities andChallenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices .

Conference · Fri Jul 01 00:00:00 EDT 2022

DOI:https://doi.org/10.2172/2004228· OSTI ID:2004228

Deitz, Julia; Perry, Daniel; Polonsky, Andrew; Ruggles, Timothy; Jungjohann, Katherine; McBrayer, Josefine; Harrison, Katharine; Michael, Joseph Richard

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: NA0003525
• OSTI ID: 2004228
• Report Number(s): SAND2022-10273C; 708729
• Country of Publication: United States
• Language: English