Atomic Structure Transformations of C-doped Ge2Sb2Te5 Using In-Situ X-ray Techniques.

Conference · Fri Jul 01 00:00:00 EDT 2022

DOI:https://doi.org/10.2172/2004032· OSTI ID:2004032

Alverson, Danielle; Olds, Daniel; Ravel, Bruce; Beechem, Thomas; Adams, David; Butala, Megan

Abstract not provided.

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

References (4)

Thermal conductivity of (Ge₂Sb₂Te₅)_1−xC_x phase change films Scott, Ethan A.; Ziade, Elbara; Saltonstall, Christopher B. Journal of Applied Physics, Vol. 128, Issue 15 https://doi.org/10.1063/5.0023476	journal	October 2020
Phase change materials and phase change memory Raoux, Simone; Xiong, Feng; Wuttig, Matthias MRS Bulletin, Vol. 39, Issue 8 https://doi.org/10.1557/mrs.2014.139	journal	August 2014
ATHENA , ARTEMIS , HEPHAESTUS : data analysis for X-ray absorption spectroscopy using IFEFFIT Ravel, B.; Newville, M. Journal of Synchrotron Radiation, Vol. 12, Issue 4 https://doi.org/10.1107/S0909049505012719	journal	June 2005
Demonstration of thin film pair distribution function analysis (tfPDF) for the study of local structure in amorphous and crystalline thin films Jensen, Kirsten M. Ø.; Blichfeld, Anders B.; Bauers, Sage R. IUCrJ, Vol. 2, Issue 5 https://doi.org/10.1107/S2052252515012221	journal	July 2015

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In-situ TEM irradiation induced amorphization of Ge2Sb2Te5.

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Conference · Sat Oct 01 00:00:00 EDT 2022 · OSTI ID:2005693